ALEXANDRIA, Va., May 19 -- United States Patent no. 12,631,484, issued on May 19, was assigned to Samsung Display Co. Ltd. (Yongin-si, South Korea).
"Optical inspection device and optical inspection method" was invented by Je Won Yoo (Bucheon-si, South Korea), In Hyuk Kim (Hwaseong-si, South Korea) and Joo Yeol Lee (Seoul, South Korea).
According to the abstract* released by the U.S. Patent & Trademark Office: "An optical inspection device includes an optical measurement unit, a first probe under the optical measurement unit and configured to supply a first voltage, a base frame under the optical measurement unit and spaced from the first probe, and a second probe on a surface of the base frame facing the first probe, configured to supply...