US Patent Issued to Samsung Display on March 24 for "Defect inspection device and method for inspecting defect" (South Korean Inventors)

ALEXANDRIA, Va., March 24 -- United States Patent no. 12,584,865, issued on March 24, was assigned to Samsung Display Co. Ltd. (Yongin-si, South Korea).

"Defect inspection device and method for inspecting defect" was invented by Jeong Moon Lee (Yongin-si, South Korea) and Dae Hong Kim (Yongin-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A defect inspection device according to one or more embodiments includes an inspection device for detecting a defect by line-scanning an object, and for generating review image data for the defect, a height measurer for acquiring a reference height of the defect and a height of the defect, and for generating height data of the defect, and a defect classifier...