ALEXANDRIA, Va., Feb. 24 -- United States Patent no. 12,560,627, issued on Feb. 24, was assigned to SAMSUNG DISPLAY Co. LTD. (Gyeonggi-Do, South Korea).
"Contact inspection device" was invented by Byungsu Kim (Yongin-si, South Korea), Suk Ju Kang (Yongin-si, South Korea), Jung Min Lee (Yongin-si, South Korea) and Eun Su Jun (Yongin-si, South Korea).
According to the abstract* released by the U.S. Patent & Trademark Office: "A contact inspection device includes a support; a contact inspection module including an inspection terminal which contacts and inspects an target; a crank module coupling the contact inspection module with the support and having a double crank structure; and a driving cylinder coupled to the support and the contact in...