ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,718,139, issued on Aug. 25, was assigned to Samsung Display Co. Ltd. (Yongin-si, South Korea).
"Systems and methods for identifying manufacturing defects" was invented by Shuhui Qu (Fremont, Calif.), Janghwan Lee (Pleasanton, Calif.) and Yan Kang (Sunnyvale, Calif.).
According to the abstract* released by the U.S. Patent & Trademark Office: "Systems and method for classifying manufacturing defects are disclosed. In one embodiment, a first data sample satisfying a first criterion is identified from a training dataset, and the first data sample is removed from the training dataset. A filtered training dataset including a second data sample is output. A first machine learning model is t...