US Patent Issued to SambaNova Systems on March 3 for "Multiple test modes for a memory in an integrated circuit" (California Inventors)

ALEXANDRIA, Va., March 3 -- United States Patent no. 12,567,476, issued on March 3, was assigned to SambaNova Systems Inc. (Palo Alto, Calif.).

"Multiple test modes for a memory in an integrated circuit" was invented by Thomas Ziaja (Palo Alto, Calif.), Uma Durairajan (Palo Alto, Calif.) and Dinesh R. Amirtharaj (Palo Alto, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "An integrated circuit (IC) includes a memory array with M rows of N storage elements that has an N-bit wide parallel input and output, and a 1-bit wide array scan input and output. A memory built-in self-test (MBIST) circuit is connected to the memory array to generate test addresses and N-bit wide test data. Functional circuitry with ...