ALEXANDRIA, Va., July 16 -- United States Patent no. 12,669,449, issued on June 30, was assigned to SAFRAN AIRCRAFT ENGINES (Paris).
"Tomographic analysis method for detecting anomalies" was invented by Pierre Alfred Jean Duchene (Moissy-Cramayel, France) and Harmonie Celestin (Moissy-Cramayel, France).
According to the abstract* released by the U.S. Patent & Trademark Office: "A method for the tomographic analysis detects anomalies in a part. The method includes the steps of acquiring at least one three-dimensional image of the part by means of a tomography device; subdividing the image into elementary subparts; analyzing a grayscale distribution in each subpart; obtaining at least one parameter representative of said grayscale distribut...