ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,952, issued on Sept. 15, was assigned to RTM INC. (Seoul, South Korea).

"Calculation device and method for extracting feature of measurement data by using same" was invented by Sang Yeop Kim (Seoul, South Korea) and Jin Woo Park (Seoul, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "According to the present disclosure, a method of extracting a feature of measurement data using a computing apparatus may include identifying measurement data obtained during a process, identifying target data related to the measurement data, performing a computation on the measurement data based on the target data, extracting a plurality of first values by ...