ALEXANDRIA, Va., Aug. 5 -- United States Patent no. 12,699,074, issued on Aug. 4, was assigned to ROHR INC. (Chula Vista, Calif.).

"Robotic non-destructive testing probe mount" was invented by Ee Hwee Lim (Singapore), Pravin Ishwardas Rajwani (Singapore) and Ann Soon Anson Tan (Singapore).

According to the abstract* released by the U.S. Patent & Trademark Office: "An apparatus for non-destructive testing of a component is disclosed herein. The apparatus comprises a robotic arm, a probe holder, a probe connected to the robotic arm via the probe holder, and a controller configured to move the robotic arm to move the probe over a surface of a component to be tested. The probe holder comprises a spring assembly for biasing the probe towards t...