US Patent Issued to Rohde & Schwarz on June 16 for "Measurement system for measuring an intercept point value of a device-under-test" (German Inventor)

ALEXANDRIA, Va., June 16 -- United States Patent no. 12,659,772, issued on June 16, was assigned to Rohde & Schwarz GmbH & Co. KG (Munich).

"Measurement system for measuring an intercept point value of a device-under-test" was invented by Matthias Ruengeler (Kirchheim, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "The invention relates to a measurement system for measuring an intercept point, IPx, value of a device-under-test, DUT. The system includes: an input port arranged for being directly or indirectly connected to the DUT; and a measurement unit which is connected to the input port. The input port is configured to receive a first CW signal, a second CW signal, and at least one intermodulation ...