US Patent Issued to Rockwell Collins on Nov. 3 for "Inspection of microelectronics using neural network" (Iowa Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,784,341, issued on Nov. 3, was assigned to Rockwell Collins Inc. (Cedar Rapids, Iowa).

"Inspection of microelectronics using neural network" was invented by Shih-Yih Young (Marion, Iowa) and Kristen Jerome (Monticello, Iowa).

According to the abstract* released by the U.S. Patent & Trademark Office: "A trained neural network model is used to identify anomalous solder balls in a ball grid array assembly. An x-ray system captures 3D x-ray model that is used to train the neural network model. The 3D x-ray model is converted into a colored 2D image. The image is discretized to generate a first image stack, a second image stack, and a third image stack. The image stacks are converted into ...