US Patent Issued to Rockwell Automation Technologies on Sept. 29 for "Employing a batch model in root cause analysis of industrial batch performance analytics" (American, Indian Inventors)

ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,748,411, issued on Sept. 29, was assigned to Rockwell Automation Technologies Inc. (Mayfield Heights, Ohio).

"Employing a batch model in root cause analysis of industrial batch performance analytics" was invented by Dennis J. Luo (Germantown, Wis.), Meiling He (Shorewood, Wis.), Justice Darko (Charlotte, N.C.), Ishit Patni (Pune, India), Fatime Ly Seymour (Charlotte, N.C.) and Francisco P. Maturana (Lyndhurst, Ohio).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method may include receiving, via a processing system, a selection of a first dataset associated with one or more operations of one or more industrial automation components of an industrial sy...