US Patent Issued to RIGAKU on March 31 for "Measuring device for x-ray emission spectrochemical analysis" (Japanese Inventors)

ALEXANDRIA, Va., March 31 -- United States Patent no. D1,120,783, issued on March 31, was assigned to RIGAKU Corp. (Tokyo).

"Measuring device for x-ray emission spectrochemical analysis" was invented by Hikari Takahara (Takatsuki, Japan), Kenji Ikesaka (Takatsuki, Japan), Koichi Aoyagi (Takatsuki, Japan), Kazuki Matsufuji (Osaka, Japan) and Shinya Ikejiri (Osaka, Japan).

The patent was filed on Nov. 27, 2024, under Application No. D/524,091.

*For further information, including images, charts and tables, please visit: http://patft.uspto.gov/netacgi/nph-Parser?Sect1=PTO2&Sect2=HITOFF&p=1&u=%2Fnetahtml%2FPTO%2Fsearch-bool.html&r=1&f=G&l=50&co1=AND&d=PTXT&s1=D1120783&OS=D1120783&RS=D1120783

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