US Patent Issued to RIGAKU on July 21 for "Analysis apparatus, system, method, and program" (Japanese Inventors)

ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,510, issued on July 21, was assigned to RIGAKU Corp. (Tokyo).

"Analysis apparatus, system, method, and program" was invented by Rieko Suenaga (Akishima, Japan) and Yoshiyasu Ito (Akishima, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An analysis apparatus for calculating an index indicating an optimization degree of a model with respect to measurement data includes processing circuitry configured to calculate an index indicating an optimization degree of a model including information of an electron density distribution with respect to measurement data, a probability distribution function followed by the measurement data being known, acquire ...