ALEXANDRIA, Va., Aug. 5 -- United States Patent no. 12,699,062, issued on Aug. 4, was assigned to RIGAKU Corp. (Tokyo).
"Analysis apparatus, analysis method, and analysis program" was invented by Yoshiyasu Ito (Akishima, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "An analysis apparatus includes processing circuitry configured to store data of a scattering intensity measured by transmission of X-rays in one Omega scan, perform coordinate conversion from the coordinate of the scattering vector to the coordinate of the tilt of the scattering body, with respect to a waveform based on the intensity of a specific diffraction point on the two-direction components, specify a peak position of the waveform of...