ALEXANDRIA, Va., July 14 -- United States Patent no. 12,682,449, issued on July 14, was assigned to Relativity Space Inc. (Long Beach, Calif.).
"Automated defect recognition and determinations of pore cluster compliance" was invented by Christopher Sacco (Long Beach, Calif.), Viraj Sinha (Long Beach, Calif.), Kyle Buzza (Long Beach, Calif.), Salik Syed (Long Beach, Calif.), Andrew Taormina (Long Beach, Calif.), Bryson Jones (Long Beach, Calif.), Cem Tutum (Long Beach, Calif.) and Jeffrey Rossin (Long Beach, Calif.).
According to the abstract* released by the U.S. Patent & Trademark Office: "A process can obtain a RT image of an article from the RT imaging system, the article comprising a reference feature, identify a first portion and a s...