ALEXANDRIA, Va., March 17 -- United States Patent no. 12,578,498, issued on March 17, was assigned to Rapiscan Holdings Inc. (Torrance, Calif.).
"Calibration method and device therefor" was invented by Emmanuel St-Aubin (St-Laurent, Canada), Philippe Desjeans-Gauthier (St-Laurent, Canada), Ola El Bakry (St-Laurent, Canada), Simon Archambault (St-Laurent, Canada) and William Awad (St-Laurent, Canada).
According to the abstract* released by the U.S. Patent & Trademark Office: "A method of determining at least one x-ray scanning system geometric property includes the steps of positioning a calibration device inside a scanning chamber of the scanning device, the chamber being intersected by at least one fan beam of x-rays during a scanning op...