US Patent Issued to RAKUTEN GROUP on July 14 for "Image scoring apparatus, image scoring method and method of machine learning" (Japanese Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,682,593, issued on July 14, was assigned to RAKUTEN GROUP INC. (Tokyo).

"Image scoring apparatus, image scoring method and method of machine learning" was invented by Hiya Roy (Tokyo), Mitsuru Nakazawa (Tokyo) and Bjorn Stenger (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided is an information-processing device including a CPU; and a memory storing instructions for causing the information-processing device, when executed by the CPU, to: include at least a machine learning model configured to receive an input image and an attribute as input, and to output at least one region in the input image and an evaluation value for each of the at leas...