US Patent Issued to Qualtec on April 14 for "Power-semiconductor-device test apparatus facilitating test-connection changes" (Japanese Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,776, issued on April 14, was assigned to Qualtec Co. Ltd. (Osaka-fu, Japan).

"Power-semiconductor-device test apparatus facilitating test-connection changes" was invented by Shigeo Sakata (Sakai, Japan), Takahiro Kajinishi (Sakai, Japan), Seiichiro Kihara (Sakai, Japan) and Hiroshi Takahara (Sakai, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "Power semiconductor-device test apparatuses carrying out gate-signal controlled on/off switching of high-amp test current for various forms of device lifespan testing. Fork plugs or like connectors are insertable through openings of choice in walls partitioning the test apparatus interior for connectio...