US Patent Issued to QUALCOMM on Sept. 15 for "On-chip test tone generator for built-in spur testing" (California Inventors)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,739,041, issued on Sept. 15, was assigned to QUALCOMM Inc. (San Diego).

"On-chip test tone generator for built-in spur testing" was invented by Shilei Hao (San Diego), Dongling Pan (San Diego), Rui Xu (San Diego) and Yiwu Tang (San Diego).

According to the abstract* released by the U.S. Patent & Trademark Office: "An apparatus is disclosed that implements an on-chip test tone generator for built-in spur testing. In an example aspect, the apparatus includes an integrated circuit with a test tone generator, at least one reference signal generator, and at least one signal propagation path. The test tone generator includes an amplitude control circuit. The at least one signal propagatio...