ALEXANDRIA, Va., May 12 -- United States Patent no. 12,627,385, issued on May 12, was assigned to QUALCOMM Inc. (San Diego).
"Techniques for wideband interference measurements" was invented by Kangqi Liu (San Diego), Weimin Duan (San Diego), Tingfang Ji (San Diego) and Jing Jiang (San Diego).
According to the abstract* released by the U.S. Patent & Trademark Office: "Various aspects of the present disclosure generally relate to wireless communication. In some aspects, a user equipment (UE) may transmit, to a network node, a capability report indicating one or more capability parameters that are associated with wideband interference measurement of an orthogonal frequency division multiplexing (OFDM) channel and a supported subband size for...