US Patent Issued to QUALCOMM on May 12 for "Quality of experience measurements for mobility robustness" (California Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,628,024, issued on May 12, was assigned to QUALCOMM Inc. (San Diego).

"Quality of experience measurements for mobility robustness" was invented by Rajeev Kumar (San Diego), Xipeng Zhu (San Diego), Shankar Krishnan (San Diego) and Gavin Bernard Horn (La Jolla, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Methods, systems, and devices for wireless communications are described. A communication link between the UE and a serving base station may be established. The UE may measure, at an application layer of the UE, a set of quality of experience variables associated with different service types. The UE may measure, at an access stratum of the UE, a s...