US Patent Issued to QUALCOMM on June 23 for "Method to prioritize gapless measurements" (Indian Inventors)

ALEXANDRIA, Va., July 15 -- United States Patent no. 12,666,295, issued on June 23, was assigned to QUALCOMM Inc. (San Diego).

"Method to prioritize gapless measurements" was invented by Mitul Vohra (Hyderabad, India), Hitesh Jain (Hyderabad, India), Sarath Kumar Pujari (Hyderabad, India) and Ansah Ahmed Sheik (Hyderabad, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "This disclosure provides systems, methods and apparatus, including computer programs encoded on computer storage media for a UE to prioritize gapless measurements. The UE receives an enquiry for capabilities of the UE with respect to a set of bands. The UE determines a portion of the set of bands that can be measured without a measurement...