US Patent Issued to QUALCOMM on June 16 for "Machine-learning-based integrated circuit test case selection" (American, Indian, Irish Inventors)

ALEXANDRIA, Va., June 16 -- United States Patent no. 12,657,364, issued on June 16, was assigned to QUALCOMM Inc. (San Diego).

"Machine-learning-based integrated circuit test case selection" was invented by Gokce Sarar (San Diego), Guillaume Shippee (La Jolla, Calif.), Rhys Buggy (Enniskerry, Ireland), Santanu Pattanayak (Bangalore, India), Tushit Jain (Bangalore, India), Suman Kumar Gunnala (San Diego), Kumar Raj (San Diego) and Vatsal Nimeshkumar Thakkar (Longmont, Colo.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Certain aspects of the present disclosure provide techniques and apparatus for testing integrated circuit designs. An example method generally includes generating a coverage matrix associated ...