US Patent Issued to QUALCOMM on Feb. 24 for "Event-based layer 1 measurement reporting" (California, New Jersey Inventors)

ALEXANDRIA, Va., Feb. 24 -- United States Patent no. 12,563,463, issued on Feb. 24, was assigned to QUALCOMM Inc. (San Diego).

"Event-based layer 1 measurement reporting" was invented by Tianyang Bai (Somerville, N.J.), Yan Zhou (San Diego) and Jelena Damnjanovic (Del Mar, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Various aspects of the present disclosure generally relate to wireless communication. In some aspects, a user equipment (UE) may measure a layer 1 (L1) metric in a candidate cell associated with a layer 1 or layer 2 triggered mobility (LTM). The UE may determine that the L1 metric in the candidate cell satisfies a triggering event condition. The UE may transmit, to a network node, an L1...