US Patent Issued to Pusan National University Industry-University Cooperation Foundation on May 19 for "Method for detecting surface defect and apparatus thereof" (South Korean Inventors)

ALEXANDRIA, Va., May 19 -- United States Patent no. 12,632,947, issued on May 19, was assigned to Pusan National University Industry-University Cooperation Foundation (Busan, South Korea).

"Method for detecting surface defect and apparatus thereof" was invented by Jin Kyu Gahm (Busan, South Korea), Il Hae Yu (Busan, South Korea) and Won June Choi (Busan, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided is a method of detecting a surface defect. The method includes acquiring a target image, detecting at least one defect area from the target image, generating a first defect matrix having a size corresponding to the target image and an element that is a first defect score calculated based on ...