US Patent Issued to PUSAN NATIONAL UNIVERSITY INDUSTRY-UNIVERSITY COOPERATION FOUNDATION on June 30 for "Apparatus and method for detecting defect using deep learning-based surface inspection" (South Korean Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,670,581, issued on June 30, was assigned to PUSAN NATIONAL UNIVERSITY INDUSTRY-UNIVERSITY COOPERATION FOUNDATION (Busan, South Korea).

"Apparatus and method for detecting defect using deep learning-based surface inspection" was invented by Jongdeok Kim (Busan, South Korea), Donghyun Kim (Busan, South Korea), Seungho Lee (Busan, South Korea), Changhong Lee (Busan, South Korea) and Jaemin Lee (Busan, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "An apparatus for detecting defects using deep learning-based surface inspection, includes: a normal image-based unsupervised training unit configured to, based on a normal image, train a reconstructiv...