ALEXANDRIA, Va., March 17 -- United States Patent no. 12,580,169, issued on March 17, was assigned to Purdue Research Foundation (West Lafayette, Ind.).

"Mass spectrometry to identify predictive failure with chemical detection in microelectronic systems" was invented by Hersh Rai (West Lafayette, Ind.).

According to the abstract* released by the U.S. Patent & Trademark Office: "The invention generally relates to systems and methods for analyzing operational status of an electronic instrument. In certain embodiments, the invention provides systems that include a sampling module that operable couples to an electronic instrument in a manner that the sampling module receives a vapor emitted from the electronic instrument, the sampling module ...