US Patent Issued to Protochips on Aug. 4 for "Systems and methods of metadata and image management for reviewing data from transmission electron microscope (TEM) sessions" (North Carolina Inventors)

ALEXANDRIA, Va., Aug. 5 -- United States Patent no. 12,700,247, issued on Aug. 4, was assigned to Protochips Inc. (Morrisville, N.C.).

"Systems and methods of metadata and image management for reviewing data from transmission electron microscope (TEM) sessions" was invented by Franklin Stampley Walden II (Raleigh, N.C.), John Damiano Jr. (Holly Springs, N.C.), David P. Nackashi (Raleigh, N.C.), Daniel Stephen Gardiner (Wake Forest, N.C.), Mark Uebel (Morrisville, N.C.), Alan Philip Franks (Durham, N.C.), Joshua Friend (Raleigh, N.C.) and Katherine Elizabeth Marusak (Cary, N.C.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed herein are methods and systems of metadata management for reviewing data fro...