ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,743,762, issued on Sept. 22, was assigned to PRATT & WHITNEY CANADA CORP. (Longueuil, Canada).
"System and method for evaluating components using thermography" was invented by Guy Joel Rocher (Mont-Royal, Canada) and Jing Fang (Toronto).
According to the abstract* released by the U.S. Patent & Trademark Office: "Systems and methods for non-destructive evaluation of components using infrared thermography are provided. A method includes mechanically exciting the component, and using an infrared sensor to acquire a thermographic image of part of the component containing a defect. Using a machine learning algorithm, a health condition of the component is determined based on the new ther...