US Patent Issued to POSTECH RESEARCH AND BUSINESS DEVELOPMENT FOUNDATION on June 16 for "Analysis method and analysis system of particles through optical observation" (South Korean Inventors)

ALEXANDRIA, Va., June 16 -- United States Patent no. 12,657,738, issued on June 16, was assigned to POSTECH RESEARCH AND BUSINESS DEVELOPMENT FOUNDATION (Pohang-si, South Korea).

"Analysis method and analysis system of particles through optical observation" was invented by Jae-Sung Park (Pohang-si, South Korea) and Si-Woo Cho (Suwon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed are an analysis method and computational system which have been developed so that the particle tracking analysis method can derive correct results under conditions with different photographing conditions for each frame when analyzing the various characteristics of individual particles through the particle tr...