ALEXANDRIA, Va., July 7 -- United States Patent no. 12,674,761, issued on July 7, was assigned to PlayNitride Display Co. Ltd. (MiaoLi County, Taiwan).
"Defect detection and removal apparatus and method" was invented by Chang-Rong Lin (MiaoLi County, Taiwan) and Ching-Liang Lin (MiaoLi County, Taiwan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A defect detection and removal apparatus including a removing unit, an image capturing unit, and a determining unit is provided. The removing unit is configured to remove at least one defective micro-element on a substrate. The image capturing unit is configured to capture a detection image of at least one defective micro-element correspondingly on the substrate. Th...