ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,728,485, issued on Sept. 8, was assigned to PANASONIC INTELLECTUAL PROPERTY MANAGEMENT Co. LTD. (Osaka, Japan).

"Bead appearance inspection device, bead appearance inspection method, program, and bead appearance inspection system" was invented by Kazuki Hanada (Osaka, Japan), Katsuaki Okuma (Osaka, Japan), Toshinari Mohri (Osaka, Japan) and Takamichi Komatsu (Osaka, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A bead appearance inspection device includes an input unit configured to enter input data related to a welding bead of a workpiece produced by welding, a first determination unit configured to perform a first inspection determination relat...