ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,738,873, issued on Sept. 15, was assigned to PANASONIC INTELLECTUAL PROPERTY MANAGEMENT Co. LTD. (Osaka, Japan).
"Frequency characteristic measurement apparatus and frequency characteristic measurement method" was invented by Yuta Shiraki (Osaka, Japan), Hiroshi Fujiwara (Osaka, Japan) and Toru Tazawa (Osaka, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "Frequency characteristics are measured with high accuracy. Frequency characteristic measurement apparatus includes first output part, frequency characteristic calculator, resonance frequency calculator, and second output part. Frequency characteristic calculator calculates a first frequency char...