ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,901, issued on Sept. 8, was assigned to PANASONIC AUTOMOTIVE SYSTEMS Co. LTD. (Kanagawa, Japan).
"Assessment apparatus and assessment method" was invented by Hiroyuki Wada (Kyoto, Japan), Yusuke Nemoto (Hyogo, Japan), Teruyoshi Hasegawa (Hyogo, Japan), Kotone Tomiie (Osaka, Japan) and Shoichiro Sekiya (Osaka, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "An assessment apparatus is an apparatus that assesses an assessment target device that includes physical components for executing processing appropriate to logical components. The assessment apparatus includes an input unit that acquires device information about the assessment target device; ...