ALEXANDRIA, Va., March 17 -- United States Patent no. 12,578,380, issued on March 17, was assigned to PAMTEK Co. LTD. (Hwaseong-si, South Korea).
"Integrated actuator test system and method for operating the same" was invented by Jae Woong Kim (Hwaseong-si, South Korea), Jung In Park (Hwaseong-si, South Korea), Hyun Wook Shin (Suwon-si, South Korea) and Hee Tae Kim (Hwaseong-si, South Korea).
According to the abstract* released by the U.S. Patent & Trademark Office: "An integrated actuator test system for performing the first test and the second test and a method for operating the system. The test system includes a control unit controlling an operation of the test system; a support socket supporting the actuator; an alignment stage suppor...