US Patent Issued to OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS on April 21 for "Material analysis with multiple detectors" (British Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,581, issued on April 21, was assigned to OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS Ltd. (High Wycombe, Great Britain).

"Material analysis with multiple detectors" was invented by Simon Burgess (High Wycombe, Great Britain), Santokh Bhadare (High Wycombe, Great Britain), Chris Tyrrell (High Wycombe, Great Britain) and Peter Statham (High Wycombe, Great Britain).

According to the abstract* released by the U.S. Patent & Trademark Office: "A detector module for use in an apparatus for analysing a specimen is provided. The detector module comprises a plurality of X-ray sensor elements and one or more electron sensor elements, and is adapted to be positioned below a polepiece of an elec...