US Patent Issued to Orbotech on Feb. 24 for "Panel design to improve accurate defect location report" (Taiwanese, South Korean, American Inventors)

ALEXANDRIA, Va., Feb. 24 -- United States Patent no. 12,561,782, issued on Feb. 24, was assigned to Orbotech Ltd. (Yavne, Israel).

"Panel design to improve accurate defect location report" was invented by Nai-Wei Chen (Tainan, Taiwan), Yueh-Nan Chen (Taichung, Taiwan), Chih-Chang Lai (New Taipei, Taiwan), Gwan Sub Lee (Incheon, South Korea) and Jongho Lee (San Jose, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "An array checker (AC) is described. The array checker may include software configured to implement a method. By implementing the method, the array checker may detect a location of a defect and then compensate for a shift in the defect. In particular, the method may include generating one or mo...