US Patent Issued to Optum Services (Ireland) on June 2 for "Techniques for measurement device calibration management using calibration offset generation machine learning models" (Irish Inventors)

ALEXANDRIA, Va., June 2 -- United States Patent no. 12,645,916, issued on June 2, was assigned to Optum Services (Ireland) Ltd. (Dublin).

"Techniques for measurement device calibration management using calibration offset generation machine learning models" was invented by Kieran O'Donoghue (Dublin), Neill Michael Byrne (Dublin) and Michael J. McCarthy (Dublin).

According to the abstract* released by the U.S. Patent & Trademark Office: "Various embodiments of the present invention utilize systems, methods, and computer program products that perform measurement device calibration management by utilizing calibration offset generation machine learning models that are generated using a model training routine that comprises, for each measuremen...