US Patent Issued to OMRON on Sept. 1 for "Quality improvement assisting device and quality improvement assisting system" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,724,405, issued on Sept. 1, was assigned to OMRON Corp. (Kyoto, Japan).

"Quality improvement assisting device and quality improvement assisting system" was invented by Hiroyuki Mori (Kyoto, Japan), Keita Saji (Kyoto, Japan), Mayuko Tanaka (Kyoto, Japan) and Katsuki Nakajima (Kyoto, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A quality improvement support apparatus that supports improvement in quality of a product produced by a production facility, including: a display unit that displays production condition information in which identification information, operation instruction state information, and a condition evaluation index are associated w...