US Patent Issued to OMRON on June 16 for "Component inspection device" (Japanese Inventors)

ALEXANDRIA, Va., June 16 -- United States Patent no. 12,657,690, issued on June 16, was assigned to OMRON Corp. (Kyoto, Japan).

"Component inspection device" was invented by Aoi Mochizuki (Kyoto, Japan), Shimpei Fujii (Kyoto, Japan) and Shinji Sugita (Kyoto, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A component inspection device including: a storage section configured to store at least a non-defective product images; a generation section configured to generate a defective product image using a machine learning model; a setting section configured for a user to set a parameter for component inspection; and an output section configured to perform inspection, by using the parameter, on the non-defecti...