ALEXANDRIA, Va., July 16 -- United States Patent no. 12,669,462, issued on June 30, was assigned to OMRON HEALTHCARE Co. LTD. (Kyoto, Japan).
"Electrolyte analysis test strip, test strip manufacturing method and electrolyte analysis device" was invented by Hideyuki Yamashita (Kyoto, Japan), Tatsuya Kobayashi (Kyoto, Japan), Maya Makita (Kyoto, Japan), Kazuya Kitayama (Kyoto, Japan) and Satoshi Nakajima (Kyoto, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "The electrolyte analysis test strip of the present invention includes a substrate extending in one direction. A first ion-sensitive film provided in a specific region on the one end side in the one direction and a first extraction electrode extending...