US Patent Issued to NXP on Feb. 17 for "Test for source synchronous interfaces" (Indian Inventors)

ALEXANDRIA, Va., Feb. 17 -- United States Patent no. 12,553,942, issued on Feb. 17, was assigned to NXP B.V. (Eindhovent, Netherlands).

"Test for source synchronous interfaces" was invented by Akhil Garg (Greater Noida, India), Sahil Jain (Ghaziabad, India), Abhishek Mahajan (Noida, India) and Amit Jindal (Sonipat, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for Design For Test (DFT) for Source Synchronous Interfaces (SSI) includes shifting a test vector into a master register slice with a DFT clock. A functional clock is generated. The test vector and the functional clock are launched from a first SSI of the master register slice. The test vector and the functional clock are captured with ...