US Patent Issued to NXP on Feb. 17 for "System and method for generating clock pulses for at-speed testing of integrated circuits" (Indian Inventors)

ALEXANDRIA, Va., Feb. 17 -- United States Patent no. 12,553,946, issued on Feb. 17, was assigned to NXP B.V. (Eindhoven, Netherlands).

"System and method for generating clock pulses for at-speed testing of integrated circuits" was invented by Chandan Gupta (Greater Noida, India), Denish Thummar (Surat, India) and Saumya Pandey (Raseda, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "An integrated circuit (IC), including a recording circuit and a clocking system, is provided. During a capture phase of an at-speed testing of the IC, the recording circuit records a number of clock pulses of a test clock signal and generates configuration data indicative of the recorded number of the clock pulses. The clock...