US Patent Issued to NXP on Aug. 25 for "System and method for controlling at-speed testing of integrated circuits" (Indian Inventors)

ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,942, issued on Aug. 25, was assigned to NXP B.V. (Eindhoven, Netherlands).

"System and method for controlling at-speed testing of integrated circuits" was invented by Chandan Gupta (Greater Noida, India), Shikhar Makkar (Palwal, India) and Saumya Pandey (Raseda, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "An integrated circuit (IC), including a clocking system, a plurality of clock gate controllers, and a plurality of clock gates, is provided. During a capture phase of an at-speed testing of the IC, the clocking system generates an at-speed clock signal including launch and capture pulses that are extracted from a reference clock signal bas...