US Patent Issued to NuFlare Technology on Oct. 6 for "Drawing data examination method, drawing method, drawing apparatus, and non-transitory storage medium" (Japanese Inventor)

ALEXANDRIA, Va., Oct. 6 -- United States Patent no. 12,755,451, issued on Oct. 6, was assigned to NuFlare Technology Inc. (Yokohama, Japan).

"Drawing data examination method, drawing method, drawing apparatus, and non-transitory storage medium" was invented by Kenichi Yasui (Kawasaki, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A drawing data examination method acquires coordinates representing the positions of a plurality of control points forming the B-spline curve; sets, as an examination target region of the drawing data, a region surrounded by a line segment connecting at least three or more control points adjacent to each other in the drawing data with a straight line after acquiring the coord...