ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,768,803, issued on Oct. 20, was assigned to NUCTECH COMPANY Ltd. (Beijing).
"Conveying system for inspection device" was invented by Qingping Huang (Beijing), Mingzhi Hong (Beijing), Jianxue Yang (Beijing), Guipei Li (Beijing) and Liguo Zhang (Beijing).
According to the abstract* released by the U.S. Patent & Trademark Office: "A conveying system for an inspection device, including an imaging system, used to scan and inspect an object; a first transmission mechanism configured to convey the object to the imaging system; and a supporting structure intersecting an inspection surface of the imaging system, where the object is pushed to slide along the supporting structure and passes thr...