US Patent Issued to NUCTECH on March 3 for "Method and device of acquiring feature information of detected object, apparatus and medium" (Chinese Inventors)

ALEXANDRIA, Va., March 3 -- United States Patent no. 12,567,226, issued on March 3, was assigned to NUCTECH COMPANY Ltd. (Beijing).

"Method and device of acquiring feature information of detected object, apparatus and medium" was invented by Li Zhang (Beijing), Zhiqiang Chen (Beijing), Ming Chang (Beijing), Xin Jin (Beijing), Qingping Huang (Beijing), Xiaofei Xu (Beijing), Mingzhi Hong (Beijing) and Liguo Zhang (Beijing).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method of acquiring feature information of a detected object is provided, including: controlling the detected object to pass through a detection apparatus; controlling an imaging system to perform radiation scanning on the detected object acqui...