US Patent Issued to NUCTECH on June 23 for "Inspection system and method" (Chinese Inventors)

ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,388, issued on June 23, was assigned to NUCTECH COMPANY Ltd. (Beijing).

"Inspection system and method" was invented by Weizhen Wang (Beijing), Bicheng Liu (Beijing), Chunguang Zong (Beijing) and Shangmin Sun (Beijing).

According to the abstract* released by the U.S. Patent & Trademark Office: "An inspection system comprises: a radiation source; a detector configured to detect a signal when radiation emitted by the radiation source acts on the inspected object; and a processor in communication connection with the radiation source and configured to determine at least one periodic radiation combination corresponding to a type of the object according to the type of the object, select...