US Patent Issued to NTT on Sept. 8 for "Electric field distribution fluctuation period measuring method and electric field distribution fluctuation period measuring device" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,138, issued on Sept. 8, was assigned to NTT Inc. (Tokyo).

"Electric field distribution fluctuation period measuring method and electric field distribution fluctuation period measuring device" was invented by Tomokazu Oda (Musashino, Japan), Atsushi Nakamura (Musashino, Japan), Daisuke Iida (Musashino, Japan) and Hiroyuki Oshida (Musashino, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An electric field distribution variation cycle measuring apparatus and method involve measuring or estimating a variation cycle of an electric field distribution in an optical fiber. Pump light and probe light may be converted into a higher-order mode and cause ...