US Patent Issued to NTT on Sept. 22 for "Deterioration determination device, deterioration determination method, and program" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,743,804, issued on Sept. 22, was assigned to NTT Inc. (Tokyo).

"Deterioration determination device, deterioration determination method, and program" was invented by Yujin Hamano (Tokyo), Kazuaki Watanabe (Tokyo), Daisuke Uchibori (Tokyo), Yosuke Sakurada (Tokyo) and Atsushi Aratake (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A deterioration determination device (2) according to the present disclosure includes an input unit (21) that receives an input of image data indicating an image including a figure of an inspection object, a correction unit (232) that generates a corrected image in which the image is corrected to increase an aspect ratio ...